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Scanning Probe Microscope

USM1200

USM1200 Scanning Probe Microscope

Ultra high vacuum Ultra low temperature

  • Resolution: XY less than 2 pm, Z less than 0.2 pm
  • Magnetic field None
  • Ultra high vacuum <10-8 Pa
  • Ultra low temperature 6–10 K Fixed temperature
  • STM (AFM is optional)
  • Possible to mount lens for optical experiments
USM1300

Best seller

USM1300 Scanning Tunneling Microscope

Ultra high vacuum Ultra low temperature (<0.4 K)
High magnetic field Vector Magnet applicable

  • Resolution: XY less than 1 pm, Z less than 0.2 pm
  • High magnetic field
    11 T, 15 T(Z axis) or Vector 2 T(X,Y axis) 9 T(Z axis)
  • Ultra high vacuum <10-8 Pa
  • Extremely-low temperature using dilution cryostat Less than 0.4 K (with 3He) Fixed temperature
  • STM (AFM is optional)
  • No optical detection function (Optical fiber can be introduced)
USM1400

USM1400 Scanning Probe Microscope

Ultra high vacuum Ultra low temperature

  • Resolution: XY less than 2 pm, Z less than 0.2 pm
  • Magnetic field None
  • Ultra high vacuum <10-8 Pa
  • Variable temperature 3–100K
  • STM (AFM is optional)
  • Possible to mount lens for optical experiments
USM1400-4P

USM1400-4P 4probe Scanning Probe Microscope

Ultra high vacuum Extremely-low temperature SEM mounted

  • Resolution: XY less than 2 pm, Z less than 0.2 pm
  • Magnetic field None
  • Ultra high vacuum <10-8 Pa
  • Variable temperature 3.5–100K
  • STM (AFM is optional)
  • Collimated light can be introduced into SPM measurement position
  • Observation at SPM measurement position by nm order accuracy using SEM
USM1400LT TERS

USM1400-LT TERS Tip-Enhanced Raman Spectroscopy

Ultra high vacuum Ultra low temperature

  • Simultaneous AFM/STM imaging and Raman spectroscopy in the UHV and LT
  • Applicable to TERS imaging with "nm" resolution
  • Offering a potential brand-new single-molecule spectroscopy tool!
  • Bulk Ag Probes are available (high enhancement factor)
  • Increase data stability and repeatability by LT measurements
USM1500

USM1500 Scanning Probe Microscope

Ultra high vacuum Ultra low temperature High magnetic field

  • Resolution: XY less than 2 pm, Z less than 0.2 pm
  • High magnetic field 8 T
  • Ultra high vacuum <10-8 Pa
  • Extremely-low temperature Less than 2.5 K Variable temperature
  • STM (AFM is optional)
  • No optical detection function (Optical fiber can be introduced)
  • Compact design (height less than 3 m, No pit construction necessary)
USM1600

USM1600 Scanning Tunneling Microscope

Dilution cryostat Ultra high vacuum Extremely-low temperature(<40 mK)
High magnetic field Vector Magnet applicable

  • Resolution: XY less than 1 pm, Z less than 0.2 pm
  • High magnetic field
    11 T, 15 T(Z axis) or Vector 2 T(X,Y axis) 9 T(Z axis)
  • Ultra high vacuum <10-8 Pa
  • Extremely-low temperature using dilution cryostat
    Less than 40 mK (with 3He) Fixed temperature
  • Dedicated to STM
  • No optical detection function
USM1800

NEW

USM1800 Scanning Probe Microscope

Cryogen-Free Ultra high vacuum low temperature

The new closed-cycle USM1800 LT UHV SPM is now part of the UNISOKU SPM product family! The USM1800 provides sample temperatures below 5K, and the cryogen-free cooling system achieves ultimate SPM performance at low temperature while allowing interruption-free measurement conditions.

SPM System Specs.

Product
No.		 Temperature Option TERS
Option		 LHe
Hold
Optical
Access
Far Field
Lens		 AFM In situ
Deposition		 Magnetic
Field		 Temperature
Variable		 High
Frequency
1GHz
USM1800
LT SPM 		300 K,
20–6 K		 ✓ ✓ ✓ N/A ✓ ✓ TBD ∞
USM1200
LT SPM 		300 K,
80 K,
(Option)
50–5 K		 ✓ ✓ ✓ N/A ✓ ✓ TBD 300 h
USM1400LL
LT SPM 		300 K,
80–5 K,
(Option)
5–3 K		 ✓ ✓ ✓ N/A ✓ ✓ ✓ 40 h
USM1400TL
LT SPM 		300 K,
80–5 K,
(Option)
5–3 K		 ✓ ✓ ✓ TBD
(0.5 T)		 ✓ ✓ ✓ 40 h
USM1500
LT SPM 		100–2 K N/A ✓ N/A 8 T
(Standard)		 ✓ ✓ N/A 4–8 Day
USM1200JT
LT SPM 		300 K,
80 K,
4–1.2 K,
(Option)
3He use :
Minimum 0.6 K		 ✓ ✓ ✓ TBD
(~ 3 T)		 ✓ ✓ TBD 250 h
USM1300
VLT STM 		80 K–350 mK N/A ✓ N/A 11 T,
15 T,
2-2-9 T,
Other		 ✓ TBD N/A 5–8 Day
USM1300J
VLT STM 		80 K–350 mK N/A ✓ N/A 11 T,
15 T,
2-2-9 T,
Other		 ✓ ✓ N/A 4–8 Day
USM1600
ULT STM 		80 K,
5 K–40 mK		 N/A ✓ N/A 11 T,
15 T,
2-2-9 T,
Other		 TBD TBD N/A 5–8 Day

  • SPM: Scanning Probe Microscope
  • STM: Scanning Tunneling Microscope
  • LT: Low Temperature
  • VLT: Very Low Temperature
  • ULT: Ultra Low Temperature