USM1400
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SPM System Specs.
Published Papers
PDF SPM System Specs. Sample Data
Extensible and flexible UHV ultra low temperature SPM
Capable of having near-field/Raman spectroscopy
This system is equipped with newly developed cryostat and utilized for new applications such as near field observation or Raman spectroscopy by using STM or the latest low temperature SPM with AFM function.
Features
- SPM measurement down to 3.0 K using newly developed cryostat
- Flexible structure capable of various options such as optical lenses, depositions at observation point and additional probes.
Applications
- Ultra low temperature STM, Inelastic tunneling spectroscopy (IETS)
- Application to various AFM functions (MFM, KFM, SCM etc.)
- Photoexcitation STM, AFM measurement
- Ultra low temperature high resolution light emission induced by tunneling current, Tip-enhanced Raman spectroscopy
- In situ deposition, Adsorption of atoms, molecules
Specifications
| SPM Head | |
|---|---|
| MAX scan range (X × Y × Z) | 1.7 × 1.7 × 0.54 µm3 @ 4.5 K |
| Resolution | Atomic resolution |
| Base temperature | 5.5–100 K (Variable) |
| Base Pressure | Obs. Prep. Ch. 3.0 ×10-8 Pa, LLC 5 ×10-5 Pa |
| STM Controller | Nanonis™ SPM control system |
| Option | |
| AFM Function | Tuning fork NC-AFM |
| Observation chamber extendability | lens stage, probe stage, high frequency application |
PDF SPM System Specs. Sample Data