PDF SPM System Specs. Published Papers

Extensible and flexible UHV ultra low temperature SPM
Capable of having near-field/Raman spectroscopy


This system is equipped with newly developed cryostat and utilized for new applications such as near field observation or Raman spectroscopy by using STM or the latest low temperature SPM with AFM function.


  • SPM measurement down to 3.0 K using newly developed cryostat
  • Flexible structure capable of various options such as optical lenses, depositions at observation point and additional probes.


  • Ultra low temperature STM, Inelastic tunneling spectroscopy (IETS)
  • Application to various AFM functions (MFM, KFM, SCM etc.)
  • Photoexcitation STM, AFM measurement
  • Ultra low temperature high resolution light emission induced by tunneling current, Tip-enhanced Raman spectroscopy
  • In situ deposition, Adsorption of atoms, molecules


SPM Head
MAX scan range (X × Y × Z) 1.7 × 1.7 × 0.54 µm3 @ 4.5 K
Resolution Atomic resolution
Base temperature 5.5–100 K (Variable)
Base Pressure Obs. Prep. Ch. 3.0 ×10-8 Pa, LLC 5 ×10-5 Pa
STM Controller Nanonis™ SPM control system
AFM Function Tuning fork NC-AFM
Observation chamber extendability lens stage, probe stage, high frequency application

PDF SPM System Specs. Sample Data