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Line-up of Probes

For STM and Multi-Probe Electrical Measurement

Platiniridium Probes (Mechanical Grind)

Image of Platiniridium Probes (mechanical grind)
Type P-50 PtIr
Shape Cone shape
Wire rod Polycrystalline PtIr 0.50 mm dia.
Length 10 mm
Polishing Mechanical grind
Curvant radius about 50 nm (without the guarantees)
Use STM measurement/multi-probe electrical contact measurement
Sales unit 1 set for 10 probes

High-Performance STM Probes

Tungsten Probes

Tungsten Probes P-100WS Tungsten Probes P-100WS SEM-img
Type P-100W
Shape Cone shape
Wire Rod Polycrystalline Tungsten 0.25 mm dia.
Length about 10 mm
Polishing Electro-polishing
Curvant Radius <35 nm
Use STM measurement
Sales Unit 1 set for 10 probes
Note Oxide layer on the surface is not removed.

Ni Probes

Ni Probes P-100Ni Ni Probes P-100Ni SEM-img
Type P-100Ni(S)
Shape Cone shape
Wire Rod Polycrystalline Ni 0.25 mm dia.
Length about 10 mm
Polishing Electro-polishing
Curvant Radius <25 nm
Use STM measurement

* It's possible to make a special order of Au or Ag coating probes. (Coating thickness: about 100 nm)
Sales Unit 1 set for 10 probes
Note STM observation in magnetic field is not allowed.

Platiniridium Probes (Electro-polishing)

Platiniridium Probes (Electro-polishing) P-100PtIr(S) Platiniridium Probes (Electro-polishing) P-100PtIr(S) SEM-img Distribution of tip apex radius
Type P-100PtIr(S)
Shape Cone shape
Wire Rod Polycrystalline PtIr 0.50 mm dia.
Length about 10 mm
Polishing Electro-polishing after mechanical grind
Curvant Radius <20 nm
Use STM measurement
Sales Unit 1 set for 10 probes

Ag Probes

Ag Probes P-100Ag Ag Probes P-100Ag SEM-img
Type P-100Ag
Shape Cone shape
Wire Rod Polycrystalline Ag 0.4 mm dia.
Length about 10 mm
Polishing Electro-polishing after mechanical grind
Curvant Radius <50 nm
Use STM measurement
Sales Unit 1 set for 5 probes

Au Probes (Φ0.1 mm)

Au Probes P-100Au (φ0.1 mm) Au Probes P-100Au (φ0.1 mm) SEM-img Au Probes P-100Au (φ0.1 mm) photo
Type P-100Au (Φ0.1 mm)
Shape Cone shape
Wire Rod Polycrystalline Au 0.1 mm dia.
Length about 10 mm
Polishing Electro-polishing after mechanical grind
Curvant Radius 20 ～ 60 nm
Use STM measurement
Sales Unit 1 set for 5 probes

※AR:aspect ratio

Au Probes (Φ0.25 mm)

Au Probes P-100Au (φ0.25 mm) Au Probes P-100Au (φ0.25 mm) SEM-img Au Probes P-100Au (φ0.25 mm) photo
Type P-100Au (Φ0.25 mm)
Shape Cone shape
Wire Rod Polycrystalline Au 0.25 mm dia.
Length about 10 mm
Polishing Electro-polishing after mechanical grind
Curvant Radius 20 ～ 40 nm
Use STM measurement
Sales Unit 1 set for 5 probes

※AR:aspect ratio

Conductive Nanoprobe for Probers

Tungsten Probes

Tungsten Probes P-100WP Tungsten Probes P-100WP SEM-img
Type P-100W
Shape Cone shape
Wire Rod Polycrystalline Tungsten 0.25 mm dia.
Length about 10 mm
Polishing Electro-polishing
Curvant Radius <35 nm
Use Multi-Probe Electrical Contact Measurement
Sales Unit 1 set for 10 probes
Note for the measurement that influence of the contact resistance is small (Oxide layer on the surface is not removed.)

Ni Probes

Ni Probes P-100Ni Ni Probes P-100Ni SEM-img
Type P-100Ni(S)
Shape Cone shape
Wire Rod Polycrystalline Ni 0.25 mm dia.
Length about 10 mm
Polishing Electro-polishing
Curvant Radius <25 nm
Use STM measurement and Multi-probe electrical contact measurement

* It's possible to make a special order of Au or Ag coating probes. (Coating thickness: about 100 nm)
Sales Unit 1 set for 10 probes

Platiniridium Probes (Electro-polishing)

Platiniridium Probes (Electro-polishing) P-100PtIr(P) Platiniridium Probes (Electro-polishing) P-100PtIr(P) SEM-img
Type P-100PtIr(P)
Shape Cone shape
Wire Rod Polycrystalline PtIr 0.50 mm dia.
Length about 10 mm
Polishing Electro-polishing
Curvant Radius <20 nm
Use Multi-probe electrical contact measurement (low contact resistance)
Sales Unit 1 set for 10 probes
Note Low contact resistance