SPM Products > Probes
Line-up of Probes
For STM and Multi-Probe Electrical Measurement
Platiniridium Probes (Mechanical Grind)
Type | P-50 PtIr |
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Shape | Cone shape |
Wire rod | Polycrystalline PtIr 0.50 mm dia. |
Length | 10 mm |
Polishing | Mechanical grind |
Curvant radius | about 50 nm (without the guarantees) |
Use | STM measurement/multi-probe electrical contact measurement |
Sales unit | 1 set for 10 probes |
High-Performance STM Probes
Tungsten Probes
Type | P-100W |
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Shape | Cone shape |
Wire Rod | Polycrystalline Tungsten 0.25 mm dia. |
Length | about 10 mm |
Polishing | Electro-polishing |
Curvant Radius | <35 nm |
Use | STM measurement |
Sales Unit | 1 set for 10 probes |
Note | Oxide layer on the surface is not removed. |
Ni Probes
Type | P-100Ni(S) |
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Shape | Cone shape |
Wire Rod | Polycrystalline Ni 0.25 mm dia. |
Length | about 10 mm |
Polishing | Electro-polishing |
Curvant Radius | <25 nm |
Use |
STM measurement
* It's possible to make a special order of Au or Ag coating probes. (Coating thickness: about 100 nm) |
Sales Unit | 1 set for 10 probes |
Note | STM observation in magnetic field is not allowed. |
Platiniridium Probes (Electro-polishing)
Type | P-100PtIr(S) |
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Shape | Cone shape |
Wire Rod | Polycrystalline PtIr 0.50 mm dia. |
Length | about 10 mm |
Polishing | Electro-polishing after mechanical grind |
Curvant Radius | <20 nm |
Use | STM measurement |
Sales Unit | 1 set for 10 probes |
Ag Probes
Type | P-100Ag |
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Shape | Cone shape |
Wire Rod | Polycrystalline Ag 0.4 mm dia. |
Length | about 10 mm |
Polishing | Electro-polishing after mechanical grind |
Curvant Radius | <50 nm |
Use | STM measurement |
Sales Unit | 1 set for 5 probes |
Au Probes (Φ0.1 mm)
Type | P-100Au (Φ0.1 mm) |
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Shape | Cone shape |
Wire Rod | Polycrystalline Au 0.1 mm dia. |
Length | about 10 mm |
Polishing | Electro-polishing after mechanical grind |
Curvant Radius | 20 ~ 60 nm |
Use | STM measurement |
Sales Unit | 1 set for 5 probes |
※AR:aspect ratio
Au Probes (Φ0.25 mm)
Type | P-100Au (Φ0.25 mm) |
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Shape | Cone shape |
Wire Rod | Polycrystalline Au 0.25 mm dia. |
Length | about 10 mm |
Polishing | Electro-polishing after mechanical grind |
Curvant Radius | 20 ~ 40 nm |
Use | STM measurement |
Sales Unit | 1 set for 5 probes |
※AR:aspect ratio
Conductive Nanoprobe for Probers
Tungsten Probes
Type | P-100W |
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Shape | Cone shape |
Wire Rod | Polycrystalline Tungsten 0.25 mm dia. |
Length | about 10 mm |
Polishing | Electro-polishing |
Curvant Radius | <35 nm |
Use | Multi-Probe Electrical Contact Measurement |
Sales Unit | 1 set for 10 probes |
Note | for the measurement that influence of the contact resistance is small (Oxide layer on the surface is not removed.) |
Ni Probes
Type | P-100Ni(S) |
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Shape | Cone shape |
Wire Rod | Polycrystalline Ni 0.25 mm dia. |
Length | about 10 mm |
Polishing | Electro-polishing |
Curvant Radius | <25 nm |
Use |
STM measurement and Multi-probe electrical contact measurement
* It's possible to make a special order of Au or Ag coating probes. (Coating thickness: about 100 nm) |
Sales Unit | 1 set for 10 probes |
Platiniridium Probes (Electro-polishing)
Type | P-100PtIr(P) |
---|---|
Shape | Cone shape |
Wire Rod | Polycrystalline PtIr 0.50 mm dia. |
Length | about 10 mm |
Polishing | Electro-polishing |
Curvant Radius | <20 nm |
Use | Multi-probe electrical contact measurement (low contact resistance) |
Sales Unit | 1 set for 10 probes |
Note | Low contact resistance |