SPM Products > Probes
Line-up of Probes
For STM and Multi-Probe Electrical Measurement
Platiniridium Probes (Mechanical Grind)
| Type | P-50 PtIr |
|---|---|
| Shape | Cone shape |
| Wire rod | Polycrystalline PtIr 0.50 mm dia. |
| Length | 10 mm |
| Polishing | Mechanical grind |
| Curvant radius | about 50 nm (without the guarantees) |
| Use | STM measurement/multi-probe electrical contact measurement |
| Sales unit | 1 set for 10 probes |
<Notice>
Due to the limited production capacity, we need to ask that we can not sell this to anyone except Unisoku SPM system users.
Even for Unisoku users, the number of orders is limited to only 1 package at once.
Thank you for your understanding.
High-Performance STM Probes
Tungsten Probes
| Type | P-100W |
|---|---|
| Shape | Cone shape |
| Wire Rod | Polycrystalline Tungsten 0.25 mm dia. |
| Length | about 10 mm |
| Polishing | Electro-polishing |
| Curvant Radius | <35 nm |
| Use | STM measurement |
| Sales Unit | 1 set for 10 probes |
| Note | Oxide layer on the surface is not removed. |
Ni Probes
.webp)
| Type | P-100Ni(S) |
|---|---|
| Shape | Cone shape |
| Wire Rod | Polycrystalline Ni 0.25 mm dia. |
| Length | about 10 mm |
| Polishing | Electro-polishing |
| Curvant Radius | <25 nm |
| Use |
STM measurement
* It's possible to make a special order of Au or Ag coating probes. (Coating thickness: about 100 nm) |
| Sales Unit | 1 set for 10 probes |
| Note | STM observation in magnetic field is not allowed. |
Platiniridium Probes (Electro-polishing)
.webp)
| Type | P-100PtIr(S) |
|---|---|
| Shape | Cone shape |
| Wire Rod | Polycrystalline PtIr 0.50 mm dia. |
| Length | about 10 mm |
| Polishing | Electro-polishing after mechanical grind |
| Curvant Radius | <20 nm |
| Use | STM measurement |
| Sales Unit | 1 set for 10 probes |
<Notice>
Due to the limited production capacity, we need to ask that we can not sell this to anyone except Unisoku SPM system users.
Even for Unisoku users, the number of orders is limited to only 1 package at once.
Thank you for your understanding.
Ag Probes
| Type | P-100Ag |
|---|---|
| Shape | Cone shape |
| Wire Rod | Polycrystalline Ag 0.4 mm dia. |
| Length | about 10 mm |
| Polishing | Electro-polishing after mechanical grind |
| Curvant Radius | <50 nm |
| Use | STM measurement |
| Sales Unit | 1 set for 5 probes |
Au Probes (Φ0.1 mm)
| Type | P-100Au (Φ0.1 mm) |
|---|---|
| Shape | Cone shape |
| Wire Rod | Polycrystalline Au 0.1 mm dia. |
| Length | about 10 mm |
| Polishing | Electro-polishing after mechanical grind |
| Curvant Radius | 20 ～ 60 nm |
| Use | STM measurement |
| Sales Unit | 1 set for 5 probes |
※AR:aspect ratio
Au Probes (Φ0.25 mm)
| Type | P-100Au (Φ0.25 mm) |
|---|---|
| Shape | Cone shape |
| Wire Rod | Polycrystalline Au 0.25 mm dia. |
| Length | about 10 mm |
| Polishing | Electro-polishing after mechanical grind |
| Curvant Radius | 20 ～ 40 nm |
| Use | STM measurement |
| Sales Unit | 1 set for 5 probes |
※AR:aspect ratio
Conductive Nanoprobe for Probers
Tungsten Probes
| Type | P-100W |
|---|---|
| Shape | Cone shape |
| Wire Rod | Polycrystalline Tungsten 0.25 mm dia. |
| Length | about 10 mm |
| Polishing | Electro-polishing |
| Curvant Radius | <35 nm |
| Use | Multi-Probe Electrical Contact Measurement |
| Sales Unit | 1 set for 10 probes |
| Note | for the measurement that influence of the contact resistance is small (Oxide layer on the surface is not removed.) |
Ni Probes
| Type | P-100Ni(S) |
|---|---|
| Shape | Cone shape |
| Wire Rod | Polycrystalline Ni 0.25 mm dia. |
| Length | about 10 mm |
| Polishing | Electro-polishing |
| Curvant Radius | <25 nm |
| Use |
STM measurement and Multi-probe electrical contact measurement
* It's possible to make a special order of Au or Ag coating probes. (Coating thickness: about 100 nm) |
| Sales Unit | 1 set for 10 probes |
Platiniridium Probes (Electro-polishing)
.webp)
| Type | P-100PtIr(P) |
|---|---|
| Shape | Cone shape |
| Wire Rod | Polycrystalline PtIr 0.50 mm dia. |
| Length | about 10 mm |
| Polishing | Electro-polishing |
| Curvant Radius | <20 nm |
| Use | Multi-probe electrical contact measurement (low contact resistance) |
| Sales Unit | 1 set for 10 probes |
| Note | Low contact resistance |
<Notice>
Due to the limited production capacity, we need to ask that we can not sell this to anyone except Unisoku SPM system users.
Even for Unisoku users, the number of orders is limited to only 1 package at once.
Thank you for your understanding.