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Scanning Probe Microscope

SPM System Table

Product No. Temperature Option TERS Option LHe Hold
Optical Access
Far Field Lens
AFM In situ Deposition Magnetic Field Temperature Variable High Frequency 1Ghz
USM1200LL
LT SPM
300 K, 80 K,
Option:50–5 K
× TBD 300 h
USM1400LL
LT SPM
300 K, 80–5 K,
Option:5–3 K
× 40 h
USM1400TL
LT SPM
300 K, 80–5 K, 5–3 K TBD
0.5 T
40 h
USM1500
LT SPM
100–2 K × × 8 T
(Standard)
× 4–8 Day
USM1300
VLT STM
80 K–350 mK × × 11 T, 15 T, 2-2-9 T, Other TBD × 5–8 Day
USM1300J
VLT STM
80 K–350 mK × × 11 T, 15 T, 2-2-9 T, Other × 4–8 Day
USM1600
ULT STM
80 K, 5 K–40 mK × × 11 T, 15 T, 2-2-9 T, Other TBD × × 5–8 Day
USM1600J
ULT STM
5 K–40 mK × × 11 T, 15 T, 2-2-9 T, Other TBD × 4–6 Day

  • SPM: Scanning Probe Microscope
  • STM: Scanning Tunneling Microscope
  • LT: Low Temperature
  • VLT: Very Low Temperature
  • ULT: Ultra Low Temperature