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Result Gallery (SPM Sample Image Data)

UHV STM System USM-1100

STM Topographic Image of Cinchonine molecules on Pt(100)

STM topographic image of Cinchonine molecules on Pt(100) -- USM-1100 Sample 1
Temperature: Room temperature
Field of View: 25nm×25nm

Yutaka Miyatake
Unisoku Co.,Ltd.
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UHV Ultra LT STM System USM-1200

STM Topographic Image of Si (100)

Large size topographic image STM of Si(100) -- USM-1200 Sample 1
Temperature: 63K
Field of View: 3nm×3nm
Dr. YOKOYAMA
in Yokohama city Univ.

STM Molecular structure and Topographic Image of COOH-Porphyrin tetramer

STM Molecular structure and Image of COOH-Porphyrin tetramer -- USM-1200 Sample 2
Temperature: 63K
Field of View: 11nm×11nm
Dr. YOKOYAMA
in Yokohama city Univ.
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UHV Ultra LT and High Magnetic Field STM System USM-1300

STM Topographic Image of Si (111)

STM Image of Si(111) -- USM-1300 Sample 1
Tempetature: 4.2K
Bias voltage: 0.84V
Tunnel current: 1.04nA
Field of veiw: 10nm×10nm
Yutaka Miyatake
Unisoku Co.,Ltd.

STM Topographic Image of vortex lattice of a superconductor NbSe2

STM Image of vortex lattice of a superconductor NbSe2 -- USM-1300 Sample 2
Temperature: 400mK
Field: 0.5T
Environment: UHV
Field of View: 250nm×250nm
Dr.HANAGURI
in Magnetic Materials Laboratory, RIKEN

STM Topographic Image and STS data of Cleaved NBS2

STM Image and STS data of Cleaved NBS2 -- USM-1300 Sample 3
Temperature: 440mK
Field of View: 7.3nm×7.3nm
Dr.HANAGURI
in Magnetic Materials Laboratory, RIKEN

Si(111) dI/dV topographic image in magnetic field(4.2K,7t) - USM-1300S 4He

Si(111) dI/dV image in magnetic field(4.2K,7T) by USM-1300S 4He -- USM-1300 Sample 3

Topo image
Sample bias 2.1V
Tunnel current 1.24nA

Topo image -- USM-1300 Sample 3

dI/dV image
Sample bias 1.2V
Tunnel current 1.24nA

dI/dV image -- USM-1300 Sample 3

dI/dV-V curve on
Si atoms

STM topographic image in 11Tesla at 400mK by USM-1300S 3He

STM image in 11Tesla at 400mK by USM-1300S 3He -- USM-1300 Sample 2
Scan size:11.7
Sample bias:2.07V
Tunnel current:740pA

Si(001) STM topographic image by USM-1300S 3He

Si(001) STM image by USM-1300S 3He -- USM-1300 Sample 2
Add the atomic structure model
N type Si(100), 0.008-0.015ohmcm
V=+1.7V, I=70pA, 668.7mK Keisuke Sagisaka, NIMS, Fujita group
published in VOLUME 91, NUMBER 14, 146103, PHYSICAL REVIEW LETTERS

Standing wave on Cu(111) surface by USM-1300S VTI

Standing wave on Cu(111) surface by USM-1300S VTI -- USM-1300 Sample 3

Yukio Hasegawa group
Univ. of Tokyo, Solid state phisics
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UHV Ultra Low Temperature SPM System USM-1400

STM Topographic Image of Si(111) surface

STM Image of Si(111) surface -- USM-1400 Sample 1
Temperature:83K
Scan area:22nm×22nm
Sample bias:1.8V
Tunnel current:0.54nA
Yuko Yamamoto
Unisoku Co.,Ltd.

STM Topographic Image of Si(100) surface

STM Image of Si(100) surface -- USM-1400 Sample 2
Temperature:83K
Scan area:12nm×5nm
Sample bias:1.2V
Tunnel current:1.0nA
Yuko Yamamoto
Unisoku Co.,Ltd.

STM Topographic Image of Si(100) surface

STM Image of Si(100) surface -- USM-1400 Sample 3
Sample:Si(100)
Temperature:83K
Scan area:20nm×20nm
Sample bias:-2V
Tunnel current:0.2nA
Yuko Yamamoto, Unisoku Co.,Ltd.

STM Topographic Image of Si(100) surface

STM Image of Si(100) surface -- USM-1400 Sample 4
Temperature:83K
Scan area:20nm×20nm
Sample bias:2V
Tunnel current:0.2nA
Yuko Yamamoto
Unisoku Co.,Ltd.
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Low Temperature 4-probe System USM-1400-4P

4 point measurement

STM Image of 4 point measurement -Low Temperature 4-probe Sample 1

Unisoku Co.,Ltd.

STM image on HOPG at 6.5K

STM Image of STM image on HOPG at 6.5K -Low Temperature 4-probe USM-1400 Sample 2

Unisoku Co.,Ltd.

Resistance of micro structure

STM Image of Resistance of micro structure -Low Temperature 4-probe USM-1400 Sample 3

Unisoku Co.,Ltd.
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4-Nano-Probe System for SEM UMP-1000

Four probes over carbon nanotube

Four probes over carbon nanotube -- USM-1400 Sample 1
Four-terminal Resistance measuremaent on Carbon Nanotube
Probe distance:<10µm Prof. Sumiyama
Nagoya Institure of Technology

SEM Image of 4 Probes bellow 10K

SEM Image of 4 Probes bellow 10K -- USM-1400 Sample 2
Scan area:1mm×1mm
Temprature:6.5K
Yutaka Miyatake
Unisoku Co.,Ltd.

SEM Image of 4 Probes bellow 10K

SEM Image of 4 Probes bellow 10K -- USM-1400 Sample 2
Scan area:15µm
Temprature:6.5K
Yutaka Miyatake
Unisoku Co.,Ltd.

Cutting CNT by 2 probes

Cutting CNT by 2 probes-1 -- USM-1400 Sample 3 Cutting CNT by 2 probes-2 -- USM-1400 Sample 3 Cutting CNT by 2 probes-3 -- USM-1400 Sample 3 Cutting CNT by 2 probes-4 -- USM-1400 Sample 3 Apply a voltage across the probes
M.Yoshimura, Ueda Lab., Toyota Technological Institute
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Advanced HV-STM System HS-1000

STM image of Mn Porpyrin molecules on Au(111)

STM Image of STM image of Mn Porpyrin molecules on Au(111) -Advanced HV-STM System HS-1000 Sample 1
scan size 10nm×10nm 1.2V 10pA

Unisoku Co.,Ltd.

STM image of Au(111) herringbone structure

STM Image of STM image of Au(111) herringbone structure -Advanced HV-STM System HS-1000 Sample 2
scan size 180nm×90nm

Unisoku Co.,Ltd.

STM atomic image of Si(111) 7×7 structure

STM Image of STM atomic image of Si(111) 7 times 7 structure -Advanced HV-STM System HS-1000 Sample 2
scan size 12.8nm×5.1nm

Unisoku Co.,Ltd.

STM atomic image of √3×√3-Ag structure on Si(111)

STM Image of STM atomic image of radical 3 times radical 3-Ag structure on Si(111) -Advanced HV-STM System HS-1000 Sample 4
scan size 12nm×12nm -0.4V 0.7nA

Unisoku Co.,Ltd.
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Extreme Physical Fields Scanning Probe Microscope

AFM Topographic Image of Si(111) surface

AFM Image of Si(111) surface -- HS-2000 Sample 1
Figure : Si (111) 7×7 by NC-AFM
Scan size:13nm×13nm
Cantilever:Piezo Resistive type(made by SII)
Frequency shift:-33Hz Ichiro Shiraki
NIMS,Miki group
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