Introduction of published papers 論文紹介
As of November 29, 2024(2024年11月29日)
"Observation of flat bands in twisted bilayer graphene"
S. Lisi et al., Nat. Phys. 17, 189 (2021).
"Quantum transport response of topological hinge modes"
M. Hossain et al., Nat. Phys. 20, 776 (2024).
"Cluster Catalysis with Lattice Oxygen: Tracing Oxygen Transport from a Magnetite(001) Support onto Small Pt Clusters"
S. Kaiser et al., ACS Catal. 11, 9519 (2021).
"Carbon monoxide adsorption on cobalt overlayers on a Si(1 1 1) surface studied by STM and XPS"
Y. He et al., Appl. Surf. Sci. 569, 151045 (2021).
"Surface morphology and electronic structure in stoichiometric superconductor CaKFe4As4 probed by scanning tunneling microscopy/spectroscopy"
X. Yu et al., Sci. China Phys. Mech. 64, 27411 (2021).
"The Influence of Local Defects on the Dynamics of O-H Bond Breaking and Formation on a Magnetite Surface"
A. Bourgund et al., J. Phys. Chem. C 123, 19742 (2019).
"A Microscopy Approach to Investigating the Energetics of Small Supported Metal Clusters"
B. A. Lechner et al., J. Phys. Chem. C 122, 22569 (2018).
"Exploring the atomic-scale dynamics of Fe3O4(001) at catalytically relevant temperatures using FastSTM"
J. Reich et al., Surf. Sci. 752, 122634 (2025).
"The Atomic and Electronic structure of 0° and 60° grain boundaries in MoS2"
T. Nakanishi et al., Front. Phys. 7, 59-1-7 (2019).
"Reduction of noise induced by power supply lines using phase-locked loop"
M. Abe et al., Rev. Sci. Instrum. 93, 113704 (2022).
"Method combining scanning tunneling microscopy and atom probe tomography for observing inside of materials"
T. Umenura, Y. Yamaguchi, S. Kurokawa, Jpn. J. Appl. Phys. 58, 066501 (2019).
"Scanning microwave microscopy applied to semiconducting GaAs structures"
A. Buchter et al., Rev. Sci. Instrum 89, 023704 (2018).
"Scanning tunneling microscopy observation of Fe deposited SrTiO3(100)-(√13 × √13)-R33.7° surface"
D. Katsube et al., J. Ceram. Soc. Jpn. 131, 665 (2023).
"Fabrication and Measurements of Inductive Devices for Scanning Microwave Microscopy"
T. Le Quang et al., IEEE-NANO DOI: 10.1109/NANO46743.2019.8993943