SPM (STM/AFM) Products

Our Scanning Probe Microscope (SPM) Systems comprising Load-Lock Chamber, Preparation Chamber and Observation Chamber is possible to exchange the probe and the sample while keeping the Ultra High Vacuum and/or the Low Temperature.

SPM System Table

RT UHV SPM USM1000

• Light angle excitation by LASER beam is possible to sample surface
• Optical access or light emission detection are possible
• Sample specimen can be heat up to 400°C at observation position

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LT UHV SPM USM1200

USM1200 series observes the sample surface in UHV at Ultra-Low Temperature by STM and/or AFM.

• STM System: USM1200S
• AFM System: USM1200A
• STM/AFM System: USM1200SA

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³He LT UHV SPM with SC Magnet USM1300

USM1300 series observe the sample surface at Low Temperature in UHV by STM or AFM and analyze surface electronic properties using various methods.

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UHV VT UHV 4-Probe SPM USM1400

The system has adopted newly designed cryostat which is built with liquid helium reservoir under the SPM stage. This configuration of the cryostat realizes the features such as: high stability of temperature, long holding time of LHe, ease of operation, and the facility for the compact design of total system.

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VT UHV 4-Probe SPM USM1400-4P

This system was developed for the electrical and physical research on nano structure at low temperature. It can be applied to various kinds of STM, AFM and multi-probing measurements.

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Sample Image Data

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⁴He LT UHV SPM with SC Magnet USM1500

Advanced Unisoku SPM technology completed a new series of the Ultra Low Temperature SPM. Compact design achieved easy operation and reasonable cost. Wide variety of applications are possible by the system.

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