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Exhibitions Information

NC-AFM2010

Period:July 31 - Aug 4, 2010
Site:Kanazawa, Japan
Content:Scanning Probe Microscope

18th International Vacuum Congress (IVC-18)

Period:23-27, Aug 2010
Site:Beijing International Convention Center, Beijing, China
Content:
Scanning Probe Microscope, Nano-Manipulator / Prober

60th JSCC Symposium, 60th Anniversary Conference on Cordination, Chemistry in Osaka

Period:27-30, Sep 2010
Site:International House, Osaka (Tennoji-ku, Osaka, Japan)
Content:Stopped-flow Systems
Cryostat For Spectrophotometer

6th International Workshop on Nano-Scale Spectroscopy and Nanotechnology

Period:25-27, Oct 2010
Site:Kobe University Centennial Hall (Rokko Hall), Kobe, JAPAN
Content:
Scanning Probe Microscope, Nano-Manipulator / Prober