SPM, STM, AFM, Scanning Probe Microscope, Cryostat for Spectrophotometer- UNISOKU

Exhibitor: Tokyo Instruments, Inc.
Period: 15-17, Feb 2012
Site: East Exhibition Hall 3,4,5,6 & Conference Tower, Tokyo Big Sight, Japan
Content:
Ultra Low Temperature and High Magnetic Field Scanning Probe Microscope,
Nano-Probe System for SEM

Period: 20-22, Mar. 2012
Site: Shanghai, China
Content:
Stopped-flow Systems
Cryostat For Spectrophotometer

Period: 24-27, Mar. 2012
Site: East Kwansei Gakuin University (UEGAHARA Campus)
Content:
Ultra Low Temperature and High Magnetic Field Scanning Probe Microscope,
Nano-Probe System for SEM