Period:Jul 5-7, 2010
Site:Koshiba Hall University of Tokyo, Hongo Campus, Tokyo, Japan
Content:Scanning Probe Microscope
Period:June 6-10, 2010
Site:Nara, Japan
Content:Stopped-flow Systems
Cryostat For Spectrophotometer
Period:May 23-26, 2010
Site:Nagoya Congress Center, Japan
Content:
Scanning Probe Microscope, Nano-Manipulator / Prober
Period:10-12 May 2010
Site:Keio Plaza Hotel Sapporo, Japan
Content:Ultra LT SPM Systems
Period:17-19 Feb 2010
Site:Tokyo Big Sight East Exhibition, Japan
Content:Ultra LT SPM Systems
Period:10-12, December 2009
Site:Atagawa Heights, Shizuoka Pre., Japan.
Content:
Ultra Low Temperature and High Magnetic Field Scanning Probe Microscope,
Nano-Probe System for SEM
Period:6-10, October 2009
Site:Nara Japan.
Content:
Ultra Low Temperature and High Magnetic Field Scanning Probe Microscope,
Nano-Probe System for SEM
Period:1-3, September 2009
Site:Beijing CHINA.
Content:
Ultra Low Temperature and High Magnetic Field Scanning Probe Microscope,
Nano-Probe System for SEM
Period:25-30, July 2009
Site:Nagoya Japan.
Content:Stopped-flow Systems
Cryostat For Spectrophotometer
Period:4-9, July 2009
Site:Sapporo Japan.
Content:Stopped-flow Systems
Cryostat For Spectrophotometer
Period:18th-21st Feb 2008
Site:Tokyo Big Sight East Exhibition, Japan
Hall3, 4, 5, 6 & Conference Tower, No.802, Japan
Content:Ultra LT SPM Systems
Period:11-13, December 2008
Site:Atagawa Heights, Shizuoka Pre., Japan.
Content:UHV Low Temperature 4-Probe SPM System
Period:3-5, December 2008
Site:Makuhari Messe Chiba, Japan
Content:
Ultra Low Temperature and High Magnetic Field Scanning Probe Microscope,
Nano-Probe System for SEM,
Nanolithography System
Period: 10-13, November 2008
Site: Jeju, Korea
Content: Stopped-flow Systems
Cryostat For Spectrophotometer
Period: 9-13, November 2008
Site: Japan Society for the Promotion of Science (JSPS), Waseda University, Japan
Content: UHV LT 4-Probe SPM System,
Nano-Probe System for SEM,
Nanolithography System
Period: 28-29, October 2008
Site: Kunibiki Messe, Matsue, Japan
Content: UHV LT 4-Probe SPM System,
Nano-Probe System for SEM
Period:19-21, Sep 2008
Site:Shandong University, China
Content:
Scanning Probe Microscope,
Nano / Micro Probe Systems
Period: 2-5, September 2008
Site: Chubu University, Japan
Content: UHV LT 4-Probe SPM System,
Nano-Probe System for SEM,
Nanolithography System
Period:27-29, August 2008
Site:KINTEX 4 Hall, Korea
Content:UHV LT 4-Probe SPM System,
Nano-Probe System for SEM,
Nanolithography System
Period:4th, July 2008
Site:Osaka Science & Technology Center
Content:Stopped-flow Systems
Period:21-23, May 2008
Site:Kyoto International Conference Center, Japan
Content:UHV LT 4-Probe SPM System,
Nano-Probe System for SEM,
Nanolithography System
Period:13th-15th Feb 2008
Site:Tokyo Big Sight East Exhibition
Hall3, 4, 5, 6 & Conference Tower, No.802, Japan
Content:Ultra LT SPM Systems
Period:6-8, December 2007
Site:Atagawa Heights, Shizuoka Pre., Japan.
Content:UHV Low Temperature 4-Probe SPM System
Period:5-7, December 2007
Site:Makuhari Messe Chiba, Japan
Content:Ultra Low Temperature and High Magnetic Field Scanning Probe Microscope,
Nano-Probe System for SEM,
Nanolithography System
Period:26-28, November 2007
Site:Ishikawa Ongakudo in Kanazawa, Japan
Content:Ultra Low Temperature and High Magnetic Field Scanning Probe Microscope,
Nano-Probe System for SEM,
Nanolithography System
Period:20-22, November 2007
Site:Chengdu,China
Content:Scanning Probe Microscope,
Nano / Micro Probe Systems
Period:11-15, November 2007
Site:Komaba Research Campus of The University of Tokyo, Tokyo, Japan
Content:Ultra LT SPM Systems
Period:18-20, Sep 2007
Site:Nanjing University, China
Content:
Scanning Probe Microscope,
Nano / Micro Probe Systems
Period:29-31, Aug 2007
Site:KINTEX, KOREA
Content:
Scanning Probe Microscope, Nano / Micro Probe Systems
*Only Poster Session
Period:25-27, July 2007
Site:Tokyo Big Sight
Hall 4, 5, 6 & Conference Tower, Japan
Content:Ultra Low Temperature and High Magnetic Field Scanning Probe Microscope,
Nano-Probe System for SEM
Nanolithography System
Period:20-22, June 2007
Site:Tokyo Big Sight
Content:Ultra Low Temperature and High Magnetic Field Scanning Probe Microscope,
Nano-Probe System for SEM
Period:June 4-6, 2007
Site:Beijing International Convention Centre (CHI-VAC booth)
Content:Scanning Probe Microscope Systems,
Nano-Probe System for SEM
Period:May 30-June 2, 2007
Site:Beijing International Convention Centre (CHI-VAC booth)
Content:Scanning Probe Microscope Systems,
Nano-Probe System for SEM
Period:21-23, Feb 2007
Site:Tokyo Big Sight East Exhibition
Hall 4, 5, 6 & Conference Tower, Japan
Content:Ultra LT SPM Systems
Period: 7-9, Dec. 2006
Site: Atagawa Heights, Japan
Content: SPM Systems
Period: 22-24, Oct. 2006
Site: Xian, China
Content: SPM Systems
Period:15-17, Sep 2006
Site: Tsinghua University, Beijing, China
Content:UHV Ultra LT and High Magnetic Field STM System
Period:21-25, Aug 2006
Site:Kyoto, Japan
Content:UHV Ultra LT and High Magnetic Field STM System
Period:1-6, Aug 2006
Site:Kyoto, Japan
Content:Ultra LT SPM Systems
SPeriod:16-20, July 2006
Site:International Conference Center,KOBE
Content:Ultra LT SPM Systems
Period:21-23, Feb. 2006
Site:Tokyo Big Sight, Japan
Content:SPM Systems and Optical Instruments