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SPM System Table

Product
No.		 Temperature Option TERS
Option		 LHe
Hold
Optical
Access
Far Field
Lens		 AFM In situ
Deposition		 Magnetic
Field		 Temperature
Variable		 High
Frequency
1Ghz
USM1200LL
LT SPM 		300 K,
80 K,
Option：
50–5 K		 ✓ ✓ ✓ N/A ✓ ✓ TBD 300 h
USM1400LL
LT SPM 		300 K,
80–5 K,
Option：
5–3 K		 ✓ ✓ ✓ N/A ✓ ✓ ✓ 40 h
USM1400TL
LT SPM 		300 K,
80–5 K,
5–3 K		 ✓ ✓ ✓ TBD
0.5 T		 ✓ ✓ ✓ 40 h
USM1500
LT SPM 		100–2 K N/A ✓ N/A 8 T
(Standard)		 ✓ N/A ✓ 4–8 Day
USM1300
VLT STM 		80 K–350 mK N/A ✓ N/A 11 T,
15 T,
2-2-9 T,
Other		 ✓ TBD N/A 5–8 Day
USM1300J
VLT STM 		80 K–350 mK N/A ✓ N/A 11 T,
15 T,
2-2-9 T,
Other		 ✓ ✓ N/A 4–8 Day
USM1600
ULT STM 		80 K,
5 K–40 mK		 N/A ✓ N/A 11 T,
15 T,
2-2-9 T,
Other		 TBD N/A N/A 5–8 Day
USM1600J
ULT STM 		5 K–40 mK N/A ✓ N/A 11 T,
15 T,
2-2-9 T,
Other		 TBD ✓ N/A 4–6 Day

  • SPM: Scanning Probe Microscope
  • STM: Scanning Tunneling Microscope
  • LT: Low Temperature
  • VLT: Very Low Temperature
  • ULT: Ultra Low Temperature