SPM, STM, AFM, Scanning Probe Microscope, Cryostat for Spectrophotometer- UNISOKU
UNISOKU for SPM, STM, AFM, Scanning Probe Microscope, Cryostat for Spectrophotometer
UNISOKU All Products
SPM(STM/AFM) Products
UHV STM / AFM USM-1100
UHV Ultra LT STM /AFM
UHV ULT High Magnetic Fields
UHV Ultra Low Temperature SPM system USM-1400 Series
UHV Ultra LT SPM / USM-1400 Result Gallery (Sample Image Data)
The system is adopted newly designed cryostat of which liquid helium reservoir is built under the SPM stage.
This configuration of the cryostat realizes the features, such as high stability of temperature, long holding time of LHe, ease of operation, and the facility for the compact design of total system.
It can be applied to various kinds of STM, AFM, SNOM, and their composite systems.
Outside view of the observation chamber / Construction of the observation chamber
for STM
for STM, AFM, SNOM
4-Probe System
System configurations and Specifications
The typical composite systems are described. All the systems consist of Load lock chamber, Preparation chamber, and Observation chamber. The probe and the sample are prepared by heat cleaning, sputtering and vapor deposition of materials in the preparation chamber. And the surface analyses are also possible to use appropriate accessories such as LEED/AES, RHEED, etc.UHV Ultra LT SPM / USM-1400 Result Gallery (Sample Image Data)
Low Temperature STM system USM-1400S
- Integrated UHV LT-STM system
- High stability and high resolution
- Wide application to metals, semiconductors, organic and absorbed molecules
- Variable temperature of sample stage is possible on request
Specification of Low Temperature STM system USM-1400S
| Vacuum degree | 10-8 Pa |
|---|---|
| Temperature | 8 K |
| Holding time | 10 hour |
| LHe volume | 6 litter |
| Scanning range | 2.5µm at RT, 0.7 µm at 10 K |
| Vibration isolation | With spring and damper |
- Coarse adjustment of sample stage is available on request
Low Temperature Multi-mode SPM System USM-1400 M
- STM and AFM mode are possible in UHV at ultra low temperature
- High stability and high resolution
- SNOM mode is possible by adopting lens stages with piezo motors
- Optical excitation is easily possible
- Versatile application to metals, semiconductors, single molecules, organic molecules, etc.
- For high resolution AFM, Piezo resistive cantilever made by SII Nano Technology Inc. can be used
Specification of Low Temperature Multi-mode SPM System USM-1400M
| Vacuum degree | 10-8 Pa |
|---|---|
| Temperature | 8 K |
| Holding time | 10 hour |
| LHe volume | 6 litter |
| Scanning range | 2.5µm at RT, 0.7 µm at 10 K |
| Vibration isolation | With spring and damper |
- Coarse adjustment of sample stage is available on request
Low Temperature 4-probe System USM-1400-4P
As a new application of the cryostat, the 4-probe STM system has been developed, and the system is applied to the measurement of local conductivity in micro and nano scale area.- 4 probe system realizes the local conductance measurement at ultra low temperature
- High resolution SEM or optical microscope can be installed for observing probe position
- 4 points measurement is possible for accurate conductivity measurement in micro to nano scale area
- STM image scanning is available on request
- Special made probe for AFM is available on request
Specification of Low Temperature 4-probe System USM-1400-4P
| Probe stage | 3 mm stroke for XYZ direction |
|---|---|
| Positioning | Less than 0.1 nm for each probe |
| Sample stage | 3 mm stroke for XY direction |
| Sample holder | Exchangeable |
| Probe holder | Exchangeable |
- Scanning function of probe or sample can be installed on request
- Scanning Electron Microscope (SEM)or optical microscope can be installed on request
UHV Ultra LT SPM / USM-1400 Result Gallery (Sample Image Data)