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Scanning Probe Microscope Control SystemUnisurface α

Scanning Probe Microscope Control System   Unisurface Alpha picture. Precise measurement sequence by full digital control. Enhancement of maintenance and support. High-Stability, Low-Noise electronics. Easy-to-Use graphical user interface.

Feature

Precise measurement sequence by full digital control.
Enhancement of maintenance and support system by modular architecture.
Superior "High-Stability" and "Low-Noise" electronics.
"Easy-to-Use" graphical user interface.

Specification of Scanning Probe Microscope Control System Unisurface α

Input Channel (Analog)4ch (Option : Additional 4ch
FeedbackDigital I control
Feedback bandwidth10 kHz
Feedback functionLinear, log, fifth polynomial system
Z direction resolution (Input / Output)16 bit / 16 bit
Current minimum detection0.8pA
Approach circuit control methodInertial drive method(Option:Stepping motor method)
Manual retractPossible
Maximum pixels1024 × 1024
Rotation of scan size360°
Real-time image display10 images
SpectroscopyI-V, I-Z, etc
Measurement PointSpecified point, Line, Grid
Other functionMultiple bias, CITS, Lithography, FFT-Power Spec.
Preamp (optional)10 7 Multiple Amplifier
10 8 Multiple Amplifier
10 9 Multiple Amplifier
Basic ComponentSPM Controller (Includes built-in 5 Standard Modules)
Power
CPU
Display (TFT 17 inch liquid crystal screen)
*Enable to buy the rack which is applied to 19 inch standard, EIA standard 4U.