SPM, STM, AFM, Scanning Probe Microscope, Cryostat for Spectrophotometer- UNISOKU

Nanoprobe (the tungsten probe coated with platiniridium) UP-100P

Multi-probing surface analysis in nano scale is important technology in the field of nanoscience and nanotechnology.
We developed the new probe due to increase the necessity of the multi-probing usage.

Picture of the UP-100P probe with the SEM

Feature

Soft contact with a sample
Small taper angle for multi-probing
Excellent cost performance

Application

Nano probing for the Nano-probe Electrical Measurement System UMP-1000
Micro probing for the High Vacuum 4-probe system UP1000-4P

Specification of Nanoprobe (the tungsten probe coated with platiniridium) UP-100P

Wire rod	Polycrystal tungsten 0.25mm diameter
Total length	about 15mm
(Change in length	Option)
Curvature radius of a tip	about 100nm(Standard)or about 50nm(for STM)
Taper angle	6.8 - 8.6 degrees
(Angle of gradient	3.4 - 4.3 degrees)
Minimum order quantity	10 probes unit

Example of an utility :
Nano-probe Electrical Measurement System UMP-1000

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