SPM, STM, AFM, Scanning Probe Microscope, Cryostat for Spectrophotometer- UNISOKU
UNISOKU for SPM, STM, AFM, Scanning Probe Microscope, Cryostat for Spectrophotometer
UNISOKU All Products
SPM(STM/AFM) Products
UHV STM / AFM USM-1100
UHV Ultra LT STM /AFM
UHV ULT High Magnetic Fields
UHV ULT SPM USM-1400
Low Temperature 4-probe System USM-1400-4P
Low Temperature 4-probe System USM-1400-4P
Low Temperature 4-probe System USM-1400-4P Result Gallery (Sample Image Data)
This system was developed for the electrical and physical research on nano structure at low temperature. It can be applied to various kinds of STM, AFM and multi-probing measurements.
Probe positioning
- Observation by SEM
- Motion controller for each probe
- Nano scale positioning in 3mm square
SPM function (option)
- STM imaging
- AFM imaging using self-detective cantilever
- Contact detectable conductive cantilever
System
- In situ exchangeable probe and sample holders
- Low temperature measurements below 10K
- Combination with other system, MBE, PLD(option)
Applications
- Conductivity on thin films
- Resistance of micro-structure
- Electrical properties of nano structure
- Measurements of device property
- SPM observation on micro-structure
Low Temperature 4-probe System USM-1400-4P Result Gallery (Sample Image Data)