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Advanced HV-STM SystemHS-1000

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Simple design
Easy to use
Wide applications
Superior cost performance
AFM measurement function addition Advanced HV-STM System HS-1000

Surface observation with high resolution is possible only in the high vacuum condition. The high end technology of UNISOKU is condensed into this compact designed system which realize many functions of operations and applications to wide variety of sample materials.

Application

STM observation metal, semiconductor, conductive materials, organic films and molecules on a conductive substrates.

Specification of Advanced HV-STM System HS-1000

Observation and preparation chamber
ChamberStainless Steel 203mmφ (electro polished)
Vacuum2×10-6 Pa
Maximum Scan rangeXY 4µm2, Z 300nm
ResolutionXY 0.1nm, Z 0.02nm
Sample heatingOhmic heating function (at preparation position)
Load-lock chamber
ChamberStainless Steel 70mmφ (electro polished)
STM controller
FeedbackDigital I control
Minimum current detection1pA
OSWindows XP Professional
Standard accessories
Cryostat for Spectrophotometer Application Example / Time-dependent UV-vis spectra Fig. HS-1000 System Front View
* The table under the STM controller is not included in this system configuration.

Options

AFM
MFM
KFM
Pump unit for ultra high vacuum
In situ Ar sputter function
In situ deposition of inorganic and organic materials
Light illumination to sample surface
Tip cleaning by electron beam heating
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